Atomic Force Microscope

Description

An atomic force microscope or AFM, is a high resolution surface profiling instrument that can produce topographical images of biological specimens. It can be operated in aqueous liquid and humid enviornments making it adept at probing biological materials and tissue without fixation and/or addition of contrast agents. It measures force through the use of a micro-cantilever sensor, so as well as imaging specimens it can measure their local mechanical properties. The AFM feels the specimen surface through a sharp tip at the end of the force sensor, which can have a radius less than 10nm. This gives the AFM the capability of measuring the nanoscale properties of materials and to acquire images of biological processes in situ.

Details

Manufacturer BRUKER
Model No. DMFSBIO2-ICON-SYS
Serial No. 44765FB2010
Location AFM (Bragg Centre) [1-086-0060-00MB-09]
Identifier 10111625
Organisation: School of Dentistry [50000074]
Owner Simon Connell
s.d.a.connell@leeds.ac.uk
0113-34-38241
Contact Neil Thomson

Category / Taxonomy Materials Characterisation > Surface Probe Microscopy > Atomic Force