SEM (FEI, Nova NanoSEM)
SEM (FEI, Nova NanoSEM)
SEM (FEI, Nova NanoSEM)
SEM (FEI, Nova NanoSEM)
Description
Scanning electron microscope EDX chemic elemental analysis. It is used for conductive and non-conductive samples. Working resolution is 1 nanometer.
Details
| Manufacturer | FEI |
|---|---|
| Model No. | NOVA NANOSEM |
| Serial No. | |
| Location | Electron Microscope [1-086-0016-00GR-G50] |
| Identifier | 10108419 |
| Organisation: | School of Chemistry [50018479] |
| Owner |
Fiona Meldrum
f.meldrum@leeds.ac.uk 0113-34-36414 |
| Contact |
Alexander Kulak
a.kulak@leeds.ac.uk 0113-34-38972 |
| Category / Taxonomy | Materials Characterisation > Electron/Ion Microscopy > Scanning |