Electron Probe MicroAnalyser

Description

Jeol 8230 with a LaB6 electron source carrying 5 wavelength spectrometers populated with 14 analysing crystals, 6 of which are high intensity/high resolution types. The Jeol 8230 has a fully integrated Jeol SDD EDS system.

Details

Manufacturer JEOL
Model No. JXA-8230
Serial No. XM16000056
Location Prayer Facility [1-086-0044-00MB-B47K]
Identifier 10099864
Organisation: School of Earth and Environment [50000062]
Owner Daniel Morgan
d.j.morgan@leeds.ac.uk
0113-34-35202
Contact Richard Walshaw
r.d.walshaw@leeds.ac.uk
0113-34-32393
Category / Taxonomy Materials Characterisation > Electron/Ion Microscopy > Scanning