Electron Probe MicroAnalyser
Electron Probe MicroAnalyser
Electron Probe MicroAnalyser
Electron Probe MicroAnalyser
Electron Probe MicroAnalyser
Description
Jeol 8230 with a LaB6 electron source carrying 5 wavelength spectrometers populated with 14 analysing crystals, 6 of which are high intensity/high resolution types. The Jeol 8230 has a fully integrated Jeol SDD EDS system.
Details
| Manufacturer | JEOL |
|---|---|
| Model No. | JXA-8230 |
| Serial No. | XM16000056 |
| Location | Scanning Electron Microscope Room [1-086-0044-00MB-B47K] |
| Identifier | 10099864 |
| Organisation: | School of Earth and Environment [50000062] |
| Owner |
Daniel Morgan
d.j.morgan@leeds.ac.uk 0113-34-35202 |
| Contact |
Richard Walshaw
r.d.walshaw@leeds.ac.uk 0113-34-32393 |
| Category / Taxonomy | Materials Characterisation > Electron/Ion Microscopy > Scanning |