FEI Tecnai TEM Machine

Description

FEI Tecnai TF20 FEGTEM Field emission gun TEM/STEM fitted with HAADF detector, Oxford Instruments INCA 350 EDX system/80mm X-Max SDD detector and Gatan Orius SC600A CCD camera. Special TEM sample facilities: (i) 2 double tilt analytical holders, (ii) Tilt/rotate analytical cooling holder, (iii) Bench-mounted ex-situ reaction/heating cell with vacuum transfer facility, (iv) Fischione plasma cleaner, (v) Gatan model 628 single tilt heating holder - up to 1200C, (vi) Nanofactory combined Scanning Tunnelling Microscope (STM) and TEM holder. TEM Sample Preparation: (i) Gatan PIPS low angle ion beam thinner, (ii) Gatan Duomill with sample cooling facility (iii) 2 Dimplers, (iv) Range of Coating units.

Details

Manufacturer FEI
Model No. TECNAI TF20
Serial No. D322
Location Electron Microscope Room [1-086-0044-00MB-B01]
Identifier 10087087
Organisation: Institute for Materials Research [50020539]
Owner Richard Drummond-Brydson
r.m.drummond-brydson@leeds.ac.uk
0113-34-32369
Contact John Harrington
j.p.harrington@leeds.ac.uk
0113-34-32559
Category / Taxonomy Materials Characterisation > Electron/Ion Microscopy > Transmission (Electron Microscopy)