Escalab250 system inc electron gun
Escalab250 system inc electron gun
Escalab250 system inc electron gun
Description
The Escalab has a high intensity monochromated Al Kα source which can be focussed to a spot 120-600 μm in diameter on the sample. This allows for high resolution XPS with a high signal to noise ratio. XPS chemical maps of a sample with a 25 μm resolution can also be obtained. The instrument also has a high intensity UV source for Ultraviolet photoelectron Spectroscopy (UPS), and a FEGSEM for SEM imaging and Scanning Auger Microscopy. A focussed argon ion miller can be used to etch the sample in order to perform depth profiling XPS experiments.
Details
| Manufacturer | THERMO VG SCIENTIFIC |
|---|---|
| Model No. | ESCALAB250 |
| Serial No. | |
| Location | XPS (Bio-Nano) and (Bragg Centre) [1-086-0060-00GR-15] |
| Identifier | 10048629 |
| Organisation: | School of Physics and Astronomy [50018481] |
| Owner |
Stephen Evans
s.d.evans@leeds.ac.uk 0113-34-33852 |
| Contact |
Benjamin Johnson
b.r.g.johnson@leeds.ac.uk 0113-34-37127 |
| Category / Taxonomy | Materials Characterisation > Electron/Ion Microscopy > Scanning Materials Characterisation > Spectroscopy > Auger Materials Characterisation > Spectroscopy > X-Ray Photoemission Materials Characterisation > Spectroscopy > Optical (Spectroscopy) (Genus) |