X-Ray Camera Siemans
X-Ray Camera Siemans
X-Ray Camera Siemans
X-Ray Camera Siemans
X-Ray Camera Siemans
Description
An X-ray diffractometer dedicated for thin film low angle X-ray reflectometry measurements for thin film deposition rate and surface characterisation. This system has largely been superseded by the Bruker D8 Discovery system for higher end applications.
Details
| Manufacturer | SIEMENS |
|---|---|
| Model No. | PX8636/8637 |
| Serial No. | |
| Location | X-ray [1-086-0060-03FL-05] |
| Identifier | 10048562 |
| Organisation: | School of Physics and Astronomy [50018481] |
| Owner |
Bryan Hickey
b.j.hickey@leeds.ac.uk 0113-34-33836 |
| Contact |
Mannan Ali
m.ali2@leeds.ac.uk 0113-34-33833 |
| Category / Taxonomy | Materials Characterisation > Diffraction > X-ray (Diffraction) |